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74F640 Datasheet(PDF) 5 Page - NXP Semiconductors |
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74F640 Datasheet(HTML) 5 Page - NXP Semiconductors |
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5 / 11 page ![]() Philips Semiconductors Product specification 74F640 Octal bus transceiver, inverting (3-State) 1989 Nov 27 5 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX UNIT A0–A7 IO = 3mA ±10%VCC 2.4 V VO High level output voltage B0–B7 VCC = MIN, VIL = MAX IOH = –3mA ±5%VCC 2.7 3.3 V VOH High-level output voltage B0 B7 VIL = MAX, VIH = MIN IO = 15mA ±10%VCC 2.0 V B0–B7 IOH = –15mA ±5%VCC 2.0 V A0 A7 IO = 24mA ±10%VCC 0.35 0.50 V VO Low level output voltage A0–A7 VCC = MIN, VIL = MAX IOL = 24mA ±5%VCC 0.35 0.50 V VOL Low-level output voltage B0 B7 VIL = MAX, VIH = MIN, IO = MAX ±10%VCC 0.55 V B0–B7 IOL = MAX ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum OE, T/R VCC = 0.0V, VI = 7.0V 100 µA II input voltage A0–A7, B0–B7 VCC = 5.5V, VI = 5.5V 1.0 mA IIH High-level input current OE, T/R VCC = MAX, VI = 2.7V 40 µA IIL Low-level input current T/R only VCC = MAX, VI = 0.5V –40 µA IOZH+IIH Off-state output current, High level of voltage applied VCC = MAX, VI = 2.7V 70 µA IOZL+IIL Off-state output current, Low level of voltage applied VCC = MAX, VI = 0.5V –70 µA IOS Short-circuit output cur- NO TAG A0–A7 VCC = MAX –60 –150 mA IOS rentNO TAG B0–B7 VCC = MAX –100 –225 µA ICCH T/R = An = 4.5V, OE = GND 66 85 mA ICC Supply current (total) ICCL VCC = MAX T/R = Bn = OE = GND 91 120 mA ICCZ T/R = Bn = GND, OE = 4.5V 78 102 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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