6.8 Electrical Characteristics: UA78L12 (for both legacy and new chip) (continued)

at specified junction temperature, VI = 19 V, CIN = 0.33 µF, COUT = 0.1µF and IO = 40 mA (unless otherwise noted)((1))

PARAMETER

TEST CONDITIONS(2)

MIN

TYP

MAX

UNIT

Bias current change

TJ = 0°C to 125°C

VI = 16 V to 27 V (legacy chip)

1.5

mA

IO = 1 mA to 40 mA

UA78L12C (legacy

chip)

0.2

UA78L12AC (legacy

chip)

0.1

TJ = 0°C to 125°C

VI = 16 V to 27 V (new chip)

0.450

IO = 1 mA to 40 mA

UA78L12C (new

chip)

0.01

UA78L12AC (new

chip)

0.01

(1)

Applies to UA78L12C and UA78L12AC.

(2)

Pulse-testing techniques maintain TJ as close to TA as possible. Thermal effects must be taken into account separately. For legacy

chip, temperature range for the UA78L12C, UA78L12AC is TJ = 0°C to 125°C. For new chip, temperature range for the UA78L12C and

UA78L12AC is TJ = –40°C to 125°C.

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UA78L

SLVS010W – JANUARY 1976 – REVISED APRIL 2023

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