AM29F800T datasheet(26/41 Pages) AMD

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Am29F800T/Am29F800B

8/18/97

PR E L IM IN A R Y

AC CHARACTERISTICS

Read-only Operations Characteristics

Figure 7.

Test Conditions

Parameter

Symbols

Description

Test Setup

Speed Options (Notes 1

and 2)

Unit

JEDEC

Standard

-70

-90

-120

-150

tAVAV

tRC

Read Cycle Time (Note 4)

Min

120

150

tAVQV

tACC

Address to Output Delay

CE = VIL

Max

120

150

OE = VIL

tELQV

tCE

Chip Enable to Output Delay

OE = VIL

Max

120

150

tGLQV

tOE

Output Enable to Output Delay

Max

tEHQZ

tDF

Chip Enable to Output High Z (Notes 3, 4)

Max

tGHQZ

tDF

Output Enable to Output High Z (Notes 3, 4)

Max

tAXQX

tOH

Output Hold Time From Addresses, CE,

or OE, Whichever Occurs First

Min

tReady

RESET Pin Low to Read Mode (Note 4)

Max

µs

tELFL

CE to BYTE Switching Low or High

Max

tELFH

tFLQZ

BYTE Switching Low to Output High Z

(Note 3)

Max

Notes:

1. Test Conditions (for -70 only):

Output Load: 1 TTL gate and 30 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.0 V to 3.0 V

Timing measurement reference level

input and output voltage: 1.5 V

2. Test Conditions (for all others):

Output Load: 1 TTL gate and 100 pF

Input rise and fall times: 20 ns

Input pulse levels: 0.45 V to 2.4 V

Timing measurement reference

level, input and output voltages:

0.8 V and 2.0 V

3. Output driver disable time.

4. Not 100% tested.

2.7 k

Ω

Diodes = IN3064

or Equivalent

6.2 k

Ω

5.0 V

IN3064

or Equivalent

Notes:

For -70: CL = 30 pF including jig capacitance

For all others: CL = 100 pF including jig capacitance

Device

Under

Test

20375C-12

AM29F800T Datasheet(PDF) 26 Page - Advanced Micro Devices

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