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MC68340 Datasheet(PDF) 385 Page - Freescale Semiconductor, Inc |
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MC68340 Datasheet(HTML) 385 Page - Freescale Semiconductor, Inc |
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385 / 441 page ![]() 9- 10 MC68340 USER’S MANUAL MOTOROLA includes a 3-bit instruction register without parity, consisting of a shift register with three parallel outputs. Data is transferred from the shift register to the parallel outputs during the update-IR controller state. The three bits are used to decode the four unique instructions listed in Table 9-3. The parallel output of the instruction register is reset to all ones in the test-logic-reset controller state. Note that this preset state is equivalent to the BYPASS instruction. Table 9-3. Instructions Code B2 B1 B0 Instruction 0 0 0 EXTEST 0 0 1 SAMPLE/PRELOAD X 1 X BYPASS 1 0 0 HI-Z 1 0 1 BYPASS During the capture-IR controller state, the parallel inputs to the instruction shift register are loaded with the standard 2-bit binary value (01) into the two least significant bits and the loss-of-crystal (LOC) status signal into bit 2. The parallel outputs, however, remain unchanged by this action since an update-IR signal is required to modify them. The LOC status bit of the instruction register indicates whether an internal clock is detected when operating with a crystal clock source. The LOC bit is clear when a clock is detected and set when it is not. The LOC bit is always clear when an external clock is used. The LOC bit can be used to detect faulty connectivity when a crystal is used to clock the device. 9.4.1 EXTEST (000) The external test (EXTEST) instruction selects the 132-bit boundary scan register. EXTEST asserts internal reset for the MC68340 system logic to force a predictable benign internal state while performing external boundary scan operations. By using the TAP, the register is capable of a) scanning user-defined values into the output buffers, b) capturing values presented to input pins, c) controlling the direction of bidirectional pins, and d) controlling the output drive of three-state output pins. For more details on the function and uses of EXTEST, please refer to the IEEE 1149.1 document. 9.4.2 SAMPLE/PRELOAD (001) The SAMPLE/PRELOAD instruction selects the 132-bit boundary scan register and provides two separate functions. First, it provides a means to obtain a snapshot of system data and control signals. The snapshot occurs on the rising edge of TCK in the capture- DR controller state. The data can be observed by shifting it transparently through the boundary scan register. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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