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89C52 Datasheet(PDF) 32 Page - NXP Semiconductors |
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89C52 Datasheet(HTML) 32 Page - NXP Semiconductors |
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32 / 39 page  Philips Semiconductors Product data 89C51/89C52/89C54/89C58 80C51 8-bit microcontroller family 4K/8K/16K/32K Flash 2002 Jan 15 32 VCC–0.5 0.45V 0.2VCC+0.9 0.2VCC–0.1 NOTE: AC inputs during testing are driven at VCC –0.5 for a logic ‘1’ and 0.45V for a logic ‘0’. Timing measurements are made at VIH min for a logic ‘1’ and VIL max for a logic ‘0’. SU00717 Figure 23. AC Testing Input/Output VLOAD VLOAD+0.1V VLOAD–0.1V VOH–0.1V VOL+0.1V NOTE: TIMING REFERENCE POINTS For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs, and begins to float when a 100mV change from the loaded VOH/VOL level occurs. IOH/IOL ≥ ±20mA. SU00718 Figure 24. Float Waveform 4 8 12 16 20 24 28 32 36 60 50 40 30 20 10 Frequency at XTAL1 (MHz) ICC (mA) SU01495 Icc IDLE MODE (TYP.) Icc MAX ACTIVE MODE (TYP.) Icc MAX. ACTIVE MODE Icc MAX. IDLE MODE 55 45 35 25 15 5 0 Figure 25. ICC vs. FREQ Valid only within frequency specifications of the device under test |
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