The information contained herein is exclusive property of. Do not copy and print except that Attend accepts.

本文件係屬立威科技股份有限公司所有；非經同意，不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。

-4 -

3. 3 shocks in each direction. Total of 6

directions.

4. Total of 18 shocks.

ENVIRONMENTAL

Item

Requirement

Test Condition

Operating

Heat Resistance

No evidence of damage

The electrical performances

should meet the spec.

specified

1. Operating test current: 0.2A

2. Mated dummy card shall be

subjected during test.

3. Temperature:70±3°C

4 Duration time: 240 hours. It shall be

maintained at standard atmospheric

condition for 30 min after measurement

shall be made.

Operating

Cold Resistance

No evidence of damage

The electrical performances

should meet the spec.

specified.

1. Operating test current: 0.2A

2. Mated dummy card shall be subjected

during test.

3. Temperature:-20±3°C

4. Duration time: 240 hours.

It shall be maintained at standard

atmospheric condition for 30 min after

measurement shall be made.

Non-Operating

Heat Resistance

No evidence of damage

The electrical performances

should meet the spec.

specified

1. Mated dummy card shall be subjected

during test.

2. Temperature:85±3°C

3. Duration time: 240 hours.

It shall be maintained at standard

atmospheric condition for 30 min after

measurement shall be made.

Non-Operating

Cold Resistance

No evidence of damage

The electrical performances

should meet the spec.

specified.

1. Mated dummy card shall be subjected

during test.

2. Temperature:-40±3°C

3. Duration time: 240 hours.

It shall be maintained at standard

atmospheric condition for 30 min after

measurement shall be made

Non-Operating

Thermal Shock

No evidence of damage

The electrical performances

should meet the spec.

specified.

Subject mated connector to 32 cycles

between -40 ± 3°C/ 30 minutes and +85

±3°C/ 30 minutes

MIL-STD-202, Method 107

Operating Temperature

No evidence of damage

The electrical performances

1. Operating test current: 0.2A

2. Mated dummy card shall be subjected

during test.