The information contained herein is exclusive property of. Do not copy and print except that Attend accepts.

本文件係屬立威科技股份有限公司所有；非經同意，不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。

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Left Oblique

Insertion Resistance

As show below, No problem to

connector performance

The actual card with evaluation Tray is

inserted by left oblique, and ejected

(pushing Eject Bar).

It is Repeated 100 cycles.

Right Oblique

Insertion Resistance

As show below, No problem to

connector performance

The actual card with evaluation Tray is

inserted by right oblique, and ejected

(pushing Eject Bar).

It is Repeated 100 cycles

Tray Reversed

Insertion Resistance

As show below, No problem to

connector performance

The evaluation tray is reversed and the

load of 2kg is added in 20 seconds

(50cycle)

Cutting-SIM Card

Test

No evidence of damage

The electrical performances

should meet the spec.

specified

5pcs Micro SIM cut into Nano SIM

(Micro SIM type thickness: 0.84mm)

Test method: 1,000 cycles as defined

to insert cutting-SIM card into the

connector, and remove the cutting-SIM

card.

Misuse test For SIM

Card Connector

Testing orientation of object:

Normal/ Reverse/ Bottom-up

Sample quantity: 5(straight)+

5(left slant)+5(right

slant)+5(upper slant)+

5(lower slant)

No problem to connector

performance

Insert the maximum size micro SD

conn card along straight/left slant/right

slant/upper slant/lower slant

deflection, and then remove Micro SD

tray. Perform this action for 10 times

for each sample. Totally for 5 samples

for each side