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FT18 Datasheet(PDF) 3 Page - NXP Semiconductors |
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FT18 Datasheet(HTML) 3 Page - NXP Semiconductors |
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3 / 16 page ![]() 2000 January 3 Philips Semiconductors Product specification Frame Transfer CCD Image Sensor FT 18 Architecture of the FT 18 The FT18 consists of a shielded storage section and an open image section. Both sections have the same structure with identical cells and properties. The only difference between the two sections is the optical light shield. The optical centres of all pixels in the image section form a square grid. The charge is generated and integrated in this section. The image section is controlled by four image clocks (A1 to A4). After integration, the image charge is completely shifted to the storage section. The integration time is electronically controlled by charge reset (CR). The storage section is controlled by four storage clocks (B1 to B4). An output register is located below the storage section for read-out. The output register has buffers at both ends. This allows either normal or mirrored read-out. Transport of the pixels in the output register is controlled by three register clock phases (C1 to C3).The register can be used for vertical binning. Horizontal binning can be achieved by summing pixel charges under the floating diffusion. More information can be found in the application note. Figure 2 shows the detailed internal structure. IMAGE SECTION Image diagonal Aspect ratio Active image width x height Total width x height Pixel width x height Geometric fill factor Image clock pins Capacity of each clock phase Number of active lines Number of contour lines Number of black lines Total number of lines Number of active pixels per line Number of overscan (timing) pixels per line Number of black reference pixels per line Total number of pixels per line 10.9 mm 1:1 7.680 x 7.680 mm 2 8.040 x 7.860 mm 2 7.5 x 7.5 µm 2 100% A1, A2, A3, A4 <3.75nF per pin 1024 4 (top) + 1 (bottom) 8 (top) + 11 (bottom) 1048 1024 8 (2x4) 40 (2x20) 1072 STORAGE SECTION Storage width x height Cell width x height Storage clock phases Capacity of each B phase Number of cells per line x number of lines 8.040 x 7.860 mm 2 7.5 x 7.5 µm 2 B1, B2, B3, B4 <4.1nF per pin 1072 x 1048 OUTPUT REGISTER Output buffers (three-stage source follower) Number of registers Number of register cells below storage Number of extra cells to output Output register horizontal transport clock pins Capacity of each C-clock phase Overlap capacity between neighbouring C-clocks Reset Gate clock phases Capacity of each RG 2 1 (bidirectional below storage) 1072 2 x 7 3 (C1..C3) <85pF per pin <35pF 2 pins (RGL, RGR) <15pF |
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