ADIS16501SLASHPCBZ datasheet(14/45 Pages) AD

14 / 45 page

Data Sheet

ADIS16501

TERMINOLOGY

analog.com

Rev. B | 14 of 45

Output Full-Scale Range

Output full-scale range is the guaranteed angular rate and acceler-

ation measurement range at the output of the signal chain. The

output full-scale range is specified as a minimum value and is

guaranteed across all conditions. Angular rate and acceleration

measurement are possible beyond this value. However, perform-

ance characteristics are not guaranteed.

Bias

Bias is any static (DC) error term on the output of the ADIS16501.

It is measured as the deviation from 0°/sec or 0 g without externally

applied angular rate or acceleration (including gravity). Bias is

measured after the device is soldered to the application PCB.

To reduce the influence of external physical stimuli that may exist in

the measurement system, average bias over a sufficiently long time

window. Additionally, a data rate of >1 kHz is recommended.

Gyroscope = ΩMEAS (ΩIN = 0°/sec)

To calculate accelerometer bias, take measurements at orientations

of +1 g and −1 g and calculate the average value of the two

measurements.

XL=ACCMEASgIN=+1g+ACCMEASgIN=−1g

Figure 21. Acceleration Sensitivity Measurement Process

Bias Error over Temperature

Bias error over temperature is the change in bias directly attrib-

uted to changes in temperature. Bias error over temperature is

measured relative to the bias at 25°C. Figure 22 shows the bias

error over temperature expected for a device with a bias at 25°C

equivalent to the initial (start of life) bias.

Bias drift over life can cause the offset measured at 25°C to

diverge from the initial (start of life) bias measured during module

manufacture. Figure 23 shows how the bias error over temperature

limits is adjusted to accommodate the divergence of the bias at

25°C and the initial bias.

Figure 22. Bias Error over Temperature, OFFINIT = OFFAT_25°C

Figure 23. Bias Error over Temperature, OFFINIT ≠ OFFAT_25°C (Change OF-

FAT_25°C to OFFAT_25°C)

Bias Repeatability

Bias repeatability describes the long-term offset behavior over a

variety of conditions. Bias repeatability represents a projection for

long-term aging, which is derived from the drift behaviors that

a sample of units exhibits throughout a 1000-hour, 110°C high

temperature operating life (HTOL) stress.

In-Run Bias Stability

In-run bias (offset) stability is a measure of how quickly gyroscope

(or accelerometer) outputs drift over time. In-run bias stability is

derived from the minimum of the Allan variance curve as follows:

Accelerometer Allan Variance(τ) =

12n−1

∑iACCMEASτi+1−ACCMEASτi2

Gyroscope Allan Variance(τ) =

12n−1

∑iΩMEASτi+1−ΩMEASτi2

ADIS16501/PCBZ Datasheet(PDF) 14 Page - Analog Devices

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