RT9702/A

3

DS9702/A-11

June 2007

www.richtek.com

Test Circuits

12

34

5

VIN

EN

FLG

VOUT

GND

RT9702/A

R

L

A

I

OUT

S3

C

OUT

I

L

V

OUT

R

FG

C

IN

V

IN

S2

V

FLG

VIN

EN

FLG

VOUT

GND

RT9702/A

R

L

C

OUT

I

L

V

OUT

R

FG

C

IN

V

IN

V

CE

V

FLG

VIN

EN

FLG

VOUT

GND

RT9702/A

R

L

A

I

OUT

S1

C

OUT

I

L

V

OUT

R

FG

C

IN

V

IN

V

FLG

Chip Enable

VIN

EN

FLG

VOUT

GND

RT9702/A

R

L

A

I

Supply

C

IN

V

IN

A

I

LEAK AGE

V

FLG

Chip Enable

VIN

EN

FLG

VOUT

GND

RT9702/A

I

OUT

C

OUT

V

RDS(ON)

C

IN

V

IN

V

Chip Enable

Note: Above test circuits reflected the graphs shown on “ Typical Operating Characteristics ” are as follows:

vs. Temperature

Threshold vs. Temperature, UVLO at Rising & Falling

Inrush Current Response, Soft-start Response, Ramped Load Response, Current Limit Transient Response, Thermal

Shutdown Response

1

2

3

4

5