CLC007

8

1

2

5

3

75:

75:

VCC

6

7

VIN-

133:

80.6:

VEE

133:

80.6:

VIN+

-

+

75:

75:

4

75:

75: Coax

75:

75: Coax

75:

75: Coax

75:

75: Coax

0.1 PF

0.1 PF

0.1 PF

0.1 PF

CLC007

SNLS016E – JULY 1998 – REVISED APRIL 2013

www.ti.com

Typical Application

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

ABSOLUTE MAXIMUM RATINGS

(1) (2)

Supply Voltage

6V

Output Current

30 mA

Maximum Junction Temperature

+125°C

Storage Temperature Range

−65°C to +150°C

Lead Temperature

(Soldering 10 Second)

+300°C

ESD Rating (Human body Model)

1000V

Package Thermal Resistance

θJA 8–pin SOIC

+160°C

θJC 8–pin SOIC

+105°C/W

Reliability Information

MTTF

254 Mhr

(1)

Absolute Maximum Ratings are those values beyond which the safety of the device cannot be ensured. They are not meant to imply that

the devices should be operated at these limits. The table of ELECTRICAL CHARACTERISTICS specifies conditions of device operation.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

RECOMMENDED OPERATING CONDITIONS

Supply Voltage (VCC – VEE)

+4.5V to +5.5V

2

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