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TPL5000 Datasheet(PDF) 5 Page - Texas Instruments

Part # TPL5000
Description  TPL5000 Nano-Power Programmable Timer with Watchdog Functionality
PDF  22 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

TPL5000 Datasheet(HTML) 5 Page - Texas Instruments

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TPL5000
www.ti.com
SNAS628B – JULY 2013 – REVISED DECEMBER 2014
7.5 Electrical Characteristics
(1)
Specifications are for TA =TJ = 25°C, VDD-GND=2.5 V, unless otherwise stated.
PARAMETER
TEST CONDITIONS
MIN(2)
TYP(3)
MAX(2)
UNIT
POWER SUPPLY
IVDD
Supply current(4)
PGOOD = VDD
30
50
nA
PGOOD = GND
12
nA
TIMER
tDP
Timer Delay Period
1, 2, 4, 8,
10, 16, 32,
s
64
Timer Delay drift over life time(5)
0.06%
Timer Delay drift over temperature
400
ppm/°C
tCAL
Calibration pulse width
14.063
15.625
17.188
ms
tDP to tCAL matching error
(6)
VDD
≤ 3.0 V
0.1
tDONE
DONE Pulse width (6)
100
ns
tRSTn
RSTn Pulse width
15.625
ms
tWAKE
WAKE Pulse width
31.25
ms
DIGITAL LOGIC LEVELS
VIH
Logic High Threshold
PGOOD, DONE
0.7xVDD
V
VIL
Logic Low Threshold
PGOOD, DONE
0.3xVDD
V
WAKE, TCAL
VDD-0.3
V
Iout = 100 uA
VOH
Logic output High Level
WAKE, TCAL
VDD-0.7
V
Iout = 1 mA
WAKE, TCAL
0.3
V
Iout = -100 uA
VOL
Logic output Low Level
WAKE, TCAL
0.7
V
Iout = -1 mA
VOLRSTn
RSTn Logic output Low Level
IOL= -1 mA
0.3
V
IOHRSTn
RSTn High Level output current
VOHRSTn=VDD
1
nA
(1)
Electrical Characteristics Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions
result in very limited self-heating of the device such that TJ = TA.
(2)
Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through
correlations using statistical quality control (SQC) method.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4)
The supply current does not take in account load and pull-up resistor current. Input pins are at GND or VDD.
(5)
Operational life time test procedure equivalent to10 years.
(6)
Ensured by design.
Copyright © 2013–2014, Texas Instruments Incorporated
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