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OPA548 Datasheet(PDF) 19 Page - Texas Instruments

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Part # OPA548
Description  High-Voltage (100V), High-Current (50mA) OPERATIONAL AMPLIFIERS, G = 1 Stable
PDF  36 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

OPA548 Datasheet(HTML) 19 Page - Texas Instruments

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OPEN-LOOP GAIN LINEARITY
SETTLING TIME
-50
0
-40
-30
-20
-10
10
30
40
50
OutputVoltage(V)
20
A
isaFunctionofV
andI
OL
OUT
LOAD
T =+25 C
P
°
R
L =1880W,1mV/div
89dB
106dB
74dB
R
L =900W,2mV/div
R =4.87kW
m
L
,200 V/div
R
7
R
8
R
10kW
5
R
10kW
6
R
3
R
10kW
4
R
1
R
10kW
2
InvertingResponse
MeasuredHere,V
1
CombinationofBoth
Invertingand
NoninvertingResponses,V
2
V
IN
-IN
+IN
V
OUT
OPA454
OPA454
V
OUT
-IN
+IN
A
1
A
2
OPA454
SBOS391 – DECEMBER 2007
Figure 65 shows the nonlinear relationship of AOL and
The circuit in Figure 66 is used to measure the
output voltage. As Figure 65 shows, open-loop gain is
settling time response. The left half of the circuit is a
lower with positive output voltage levels compared to
standard, false-summing junction test circuit used for
negative
voltage
levels.
Specifications
in
the
settling time and open-loop gain measurement. R1
Electrical Characteristics table are based upon the
and R2 provide the gain and allow for measurement
average gain measured at both output extremes.
without connecting a scope probe directly to the
summing junction, which can disturb proper op amp
function by causing oscillation.
The right half of the circuit looks at the combination of
both inverting and noninverting responses. R5 and R6
remove the large step response. The remaining
voltage at V2 shows the small-signal settling time that
is centered on zero. This test circuit can be used for
incoming inspection, real-time measurement, or in
designing
compensation
circuits
in
system
applications.
Table 2. Settling Time Measurement Circuit
Configuration Using Different Gain Settings for
Figure 66
GAIN
COMPONENT
1
5
10
Figure 65. Differential Input Voltage (+IN to –IN)
R1 (Ω)
10k
2k
1k
versus Output Voltage
R3 (Ω)
10k
2k
1k
R7 (Ω)
10k
4k
9k
R8 (Ω)
∞
1k
1k
VIN (VPP)
20
16
8
Figure 66. Settling Time Test Measurement Circuit
Copyright © 2007, Texas Instruments Incorporated
Submit Documentation Feedback
19
Product Folder Link(s): OPA454



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