LMV112

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SNAS297B – MAY 2005 – REVISED MAY 2013

2.7V ELECTRICAL CHARACTERISTICS

Unless otherwise specified, all limits are specified for TJ = 25°C, VDD = 2.7V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20 pF,

RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See

(1).

Symbol

Parameter

Conditions

Min(2)

Typ(3)

Max(2)

Units

Frequency Domain Response

SSBW

Small Signal Bandwidth

VIN = 0.63 VPP; −3 dB

40

MHz

FPBW

Full Power Bandwidth

VIN = 1.6 VPP; −3 dB

28

MHz

GFN

Gain Flatness < 0.1 dB

f > 100 kHz

3.4

MHz

Distortion and Noise Performance

en

Input-Referred Voltage Noise

f = 1 MHz

26

nV/

√Hz

ISOLATION

Output to Input

f = 1 MHz

91

dB

CT

Crosstalk Rejection

f = 26 MHz, PIN = 0 dBm

54

dB

Time Domain Response

tr

Rise Time

0.1 VPP Step (10-90%), f = 1 MHz

7

ns

tf

Fall Time

6

ns

ts

Settling Time to 0.1%

1 VPP Step, f = 1 MHz

118

ns

OS

Overshoot

0.1 VPP Step, f = 1 MHz

41

%

SR

Slew Rate (4)

VIN = 1.6 VPP, f = 26 MHz

110

V/µs

Static DC Performance

IS

Supply Current

Enable1,2 = VDD ; No Load

2.0

1.6

mA

2.1

Enable1,2 = VSS ; No Load

72

59

μA

78

PSRR

Power Supply Rejection Ratio

DC (3.0V to 5.0V)

58

68

dB

57

ACL

Small Signal Voltage Gain

VOUT = 0.1 VPP

0.97

1.05

1.01

V/V

0.95

1.07

VOS

Output Offset Voltage

16

0.4

mV

17

TC VOS

Temperature Coefficient Output Offset

4

µV/°C

Voltage (5)

ROUT

Output Resistance

f = 100 kHz

0.5

Ω

f = 26 MHz

140

Miscellaneous Performance

RIN

Input Resistance per Buffer

Enable = VDD

141

k

Ω

Enable = VSS

141

CIN

Input Capacitance per Buffer

Enable = VDD

2.3

pF

Enable = VSS

2.3

ZIN

Input Impedance

f = 26 MHz, Enable = VDD

10.4

k

Ω

f = 26 MHz, Enable = VSS

10.9

VO

Output Swing Positive

VIN = VDD

2.65

2.69

V

2.63

Output Swing Negative

VIN = VSS

50

10

mV

65

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA .

(2)

All limits are specified by testing or statistical analysis.

(3)

Typical Values represent the most likely parametric norm.

(4)

Slew rate is the average of the positive and negative slew rate.

(5)

Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total

temperature change.

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