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LMV112 Datasheet(PDF) 4 Page - Texas Instruments |
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LMV112 Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 23 page ![]() LMV112 SNAS297B – MAY 2005 – REVISED MAY 2013 www.ti.com 2.7V ELECTRICAL CHARACTERISTICS (continued) Unless otherwise specified, all limits are specified for TJ = 25°C, VDD = 2.7V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20 pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (1). Symbol Parameter Conditions Min(2) Typ(3) Max(2) Units ISC Output Short-Circuit Current (6) Sourcing −18 −27 −13 mA Sinking 20 30 16 Ven_hmin Enable High Active Minimum Voltage 1.2 V Ven_lmax Enable Low Inactive Maximum Voltage 0.6 (6) Short-Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150°C. 5V ELECTRICAL CHARACTERISTICS Unless otherwise specified, all limits are specified for TJ = 25°C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20 pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (1). Symbol Parameter Conditions Min(2) Typ(3) Max(2) Units Frequency Domain Response SSBW Small Signal Bandwidth VIN = 0.63 VPP; −3 dB 42 MHz FPBW Full Power Bandwidth VIN = 1.6 VPP; −3 dB 31 MHz GFN Gain Flatness < 0.1 dB f > 100 kHz 4.9 MHz Distortion and Noise Performance en Input-Referred Voltage Noise f = 1 MHz 27 nV/ √Hz ISOLATION Output to Input f = 1 MHz 90 dB CT Crosstalk Rejection f = 26 MHz, PIN = 0 dBm 61 dB Time Domain Response tr Rise Time 0.1 VPP Step (10-90%), f = 1 MHz 7 ns tf Fall Time 6 ns ts Settling Time to 0.1% 1 VPP Step, f = 1 MHz 80 ns OS Overshoot 0.1VPP Step, f = 1 MHz 20 % SR Slew Rate (4) VIN = 1.6 VPP, f = 26 MHz 120 V/µs Static DC Performance IS Supply Current Enable1,2 = VDD ; No Load 3.5 2.5 mA 3.8 Enable1,2 = VSS ; No Load 80 62 μA 89 PSRR Power Supply Rejection Ratio DC (3.0V to 5.0V) 58 68 dB 57 ACL Small Signal Voltage Gain VOUT = 0.1 VPP 0.99 1.01 1.00 V/V 0.97 1.03 VOS Output Offset Voltage 16 1.3 mV 17 TC VOS Temperature Coefficient Output Offset 3 µV/°C Voltage (5) ROUT Output Resistance f = 100 kHz 0.5 Ω f = 26 MHz 118 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA . (2) All limits are specified by testing or statistical analysis. (3) Typical Values represent the most likely parametric norm. (4) Slew rate is the average of the positive and negative slew rate. (5) Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total temperature change. 4 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: LMV112 |
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