6

MAX3222

SLLS408H – JANUARY 2000 – REVISED OCTOBER 2016

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(1)

Test conditions are C1

−C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2−C4 = 0.33 μF at VCC = 5 V ± 0.5 V.

(2)

All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

6.7 Electrical Characteristics: Receiver

over operating free-air temperature range (unless otherwise noted)

(1). See Figure 8.

PARAMETER

TEST CONDITIONS

MIN

TYP(2)

MAX

UNIT

VOH

High-level output voltage

IOH = –1 mA

VCC – 0.6

VCC – 0.1

V

VOL

Low-level output voltage

IOL = 1.6 mA

0.4

V

VIT+

Positive-going input threshold

voltage

VCC = 3.3 V

1.5

2.4

V

VCC = 5 V

1.8

2.4

VIT–

Negative-going input threshold

voltage

VCC = 3.3 V

0.6

1.2

V

VCC = 5 V

0.8

1.5

Vhys

Input hysteresis (VIT+ – VIT–)

0.3

V

Ioff

Output leakage current

EN = VCC

±0.05

±10

µA

ri

Input resistance

VI = ±3 V to ±25 V

3

5

7

kΩ

(1)

Test conditions are C1

−C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2−C4 = 0.33 μF at VCC = 5 V ± 0.5 V.

(2)

All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

(3)

Pulse skew is defined as |tPLH

− tPHL| of each channel of the same device.

6.8 Switching Characteristics: Driver

over operating free-air temperature range (unless otherwise noted)

(1). See Figure 8.

PARAMETER

TEST CONDITIONS

MIN

TYP(2)

MAX

UNIT

Maximum data rate

CL = 1000 pF, RL = 3 kΩ, One DOUT switching, see

Figure 3

150

250

kbps

tsk(p)

Pulse skew(3)

CL = 150 pF to 2500 pF, RL = 3 kΩ to 7 kΩ, see

Figure 4

300

ns

SR(tr)

Slew rate, transition region

(see Figure 3)

RL = 3 kΩ to 7 kΩ, VCC = 3.3

V

CL = 150 pF to 1000

pF

6

30

V/µs

CL = 150 pF to 2500

pF

4

30

(1)

Test conditions are C1

−C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2−C4 = 0.33 μF at VCC = 5 V ± 0.5 V.

(2)

All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

(3)

Pulse skew is defined as |tPLH

− tPHL| of each channel of the same device.

6.9 Switching Characteristics: Receiver

over operating free-air temperature range (unless otherwise noted)

(1). See Figure 8.

PARAMETER

TEST CONDITIONS

MIN

TYP(2)

MAX

UNIT

tPLH

Propagation delay time, low- to high-

level output

CL = 150 pF, see Figure 5

300

ns

tPHL

Propagation delay time, high- to low-

level output

CL = 150 pF, see Figure 5

300

ns

ten

Output enable time

CL = 150 pF, RL = 3 kΩ, see

Figure 6

200

ns

tdis

Output disable time

CL = 150 pF, RL = 3 kΩ, see

Figure 6

200

ns

tsk(p)

Pulse skew(3)

See Figure 5

300

ns