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OPA358 Datasheet(PDF) 8 Page - Texas Instruments

Part # OPA358
Description  3V Single-Supply 80MHz High-Speed Op Amp in SC70
PDF  18 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

OPA358 Datasheet(HTML) 8 Page - Texas Instruments

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OPA358
SB0S296C − MARCH 2004 − REVISED FEBRUARY 2005
www.ti.com
8
VIDEO PERFORMANCE
Industry standard video test patterns include:
D Multiburst—packets of different test frequencies to
check for basic frequency response.
D Multipulse—pulses
modulated
at
different
frequencies to test for comprehensive measurement
of amplitude and group delay errors across the video
baseband.
D Chrominance-to-luminence (CCIR17) — tests ampli-
tude, phase and some distortion
Figure 2 shows the test circuits for Figure 3 through
Figure 13 and Figure 16. (NOTE: 1 and 2 indicate
measurement points corresponding to the waveforms
labeled 1 and 2 in the figures.)
1
2
a. Test circuit for Figure 3 through Figure 5.
b. Test circuit for Figure 6.
NOTE: 1 and 2 indicate measurement points
corresponding to the waveforms labeled 1 and
2 in the figures.
500
Ω
500
Ω
1
2
500
Ω
500
Ω
Figure 2. Test Circuits Used for Figure 3 through
Figure 6
FREQUENCY RESPONSE OF THE OPA358
Frequency response measurements evaluate the ability of
a video system to uniformly transfer signal components of
different frequencies without affecting their respective
amplitudes. Figure 3 shows the multiburst test pattern;
Figure 4 shows the multipulse. The top waveforms in
these figures show the full test pattern. The middle and
bottom waveform are a more detailed view of the critical
portion of the full waveform. The middle waveform
represents the input signal from the video generator; the
bottom waveform is the OPA358 output to the line.
Figure 3. Multiburst (CCIR 18) Test Pattern (PAL)
Figure 4. Multipulse Test Pattern (PAL)



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