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OPA693 Datasheet(PDF) 2 Page - Texas Instruments

Part # OPA693
Description  Triple, Ultra-Wideband, Fixed-Gain, VIDEO BUFFER with Disable
PDF  35 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

OPA693 Datasheet(HTML) 2 Page - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
(1)
TopView
SSOP
300W
300W
300W
300W
300W
300W
1
2
3
4
5
6
7
8
-INA
-INB
-INC
+INA
DISB
DISC
+INB
+INC
9
10
11
12
13
14
15
16
-VS
+V
S
+V
S
-VS
DISA
OUTC
OUTB
OUTA
OPA3693
CHA
CHB
CHC
OPA3693
SBOS353A – DECEMBER 2006 – REVISED AUGUST 2008 ............................................................................................................................................ www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
SPECIFIED
PACKAGE
TEMPERATURE
PACKAGE
ORDERING
TRANSPORT MEDIA,
PRODUCT
PACKAGE
DESIGNATOR
RANGE
MARKING
NUMBER
QUANTITY
OPA3693IDBQ
Rail, 75
OPA3693
SSOP-16
DBQ
–40°C to +85°C
OP3693
OPA3693IDBQR
Tape and Reel, 2500
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Power Supply
±6.5VDC
Internal Power Dissipation
See Thermal Analysis
Differential Input Voltage
±1.2V
Input Common-Mode Voltage Range
±VS
Storage Temperature Range
–65°C to +125°C
Lead Temperature (soldering, 10s)
+300°C
Peak
+150°C
Maximum Junction
Temperature, TJ
Continuous Operation, Long-Term Reliability
+140°C
Human Body Model (HBM)
1500V
ESD Rating
Charge Device Model (CDM)
1000V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these and any other conditions beyond
those specified is not supported.
2
Submit Documentation Feedback
Copyright © 2006–2008, Texas Instruments Incorporated
Product Folder Link(s): OPA3693



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