CC2570

CC2571

SWRS095A

– FEBRUARY 2011 – REVISED MARCH 2011

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

over operating free-air temperature range (unless otherwise noted)

VALUE

UNIT

Supply voltage

All supply pins must have the same voltage

–0.3 to 3.9

V

Voltage on any digital pin

–0.3 to VDD + 0.3, ≤ 3.9

V

Input RF level

10

dBm

Storage temperature range

–40 to 125

°C

All pads, according to human-body model,

2

kV

JEDEC STD 22, method A114

ESD

According to charged-device model, JEDEC

500

V

STD 22, method C101

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

RECOMMENDED OPERATING CONDITIONS

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

TA

Operating ambient temperature range

–40

85

°C

Operating supply voltage

2

3.6

V

ELECTRICAL CHARACTERISTICS

Measured on CC2570/71 reference design with TA = 25°C and VDD = 3 V, unless otherwise noted.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

RX current consumption

23.7

mA

TX current consumption,

–6-dBm output power

25.9

mA

TX current consumption, 0-dBm output power

28.8

mA

I

Current consumption

TX current consumption, 4-dBm output power

34.3

mA

Power-down current, 32-kHz oscillator active

1

µA

Power-down current, 32-kHz oscillator disabled

0.5

µA

GENERAL CHARACTERISTICS

Measured on CC2570/71 reference design with TA = 25°C and VDD = 3 V, unless otherwise noted.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

RADIO PART

RF frequency range

Programmable in 1-MHz steps

2400

2495

MHz

Data rate and modulation format

1 Mbps, GFSK, 160-kHz deviation

2

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© 2011, Texas Instruments Incorporated

Product Folder Link(s): CC2570 CC2571