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LF355 Datasheet(PDF) 18 Page - Texas Instruments |
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LF355 Datasheet(HTML) 18 Page - Texas Instruments |
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18 / 47 page ![]() LF155, LF156, LF256, LF257 LF355, LF356, LF357 SNOSBH0D – MAY 2000 – REVISED NOVEMBER 2015 www.ti.com 8.2 Typical Application Figure 35. Settling Time Test Circuit 8.2.1 Design Requirements Settling time is tested with the LF35x connected as unity gain inverter and LF357 connected for AV = −5 8.2.2 Detailed Design Procedure Connect the circuit components as shown in Figure 35. In particular, use FET to isolate the probe capacitance. Apply a 10-V step function to the input. Use an oscilloscope to probe the circuit as shown in Figure 35. 18 Submit Documentation Feedback Copyright © 2000–2015, Texas Instruments Incorporated LF156 LF256 LF356 |
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