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LMH6583 Datasheet(PDF) 12 Page - Texas Instruments |
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LMH6583 Datasheet(HTML) 12 Page - Texas Instruments |
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12 / 26 page ![]() LMH6583 OUTPUT BUFFER VOUT + - LMH6703 RL 1 k: 560: 560: 1 10 100 1000 -8 -7 -6 -5 -4 -3 -2 -1 0 1 2 FREQUENCY (MHz) OUTPUT CONNECTED DIRECTLY NO EXPANSION VS = ±3.3V VOUT = 2 VPP RL = 150: 1 10 100 1000 -8 -7 -6 -5 -4 -3 -2 -1 0 1 2 FREQUENCY (MHz) OUTPUT CONNECTED DIRECTLY NO EXPANSION VS = ±5V VOUT = 2 VPP RL = 150: LMH6583 SNOSAP5E – APRIL 2006 – REVISED MARCH 2013 www.ti.com Figure 36. Input Expansion Frequency Response Figure 37. Input Expansion Frequency Response DRIVING CAPACITIVE LOADS Capacitive output loading applications will benefit from the use of a series output resistor ROUT. Capacitive loads of 5 pF to 120 pF are the most critical, causing ringing, frequency response peaking and possible oscillation. For applications where maximum frequency response is needed and some peaking is tolerable, the value of ROUT can be reduced slightly from the recommended values. When driving transmission lines the 50 Ω or 75Ω matching resistor makes the series output resistor unnecessary. USING OUTPUT BUFFERING TO ENHANCE BANDWIDTH AND INCREASE RELIABILITY The LMH6583 crosspoint switch can offer enhanced bandwidth and reliability with the use of external buffers on the outputs. The bandwidth is increased by unloading the outputs and driving a higher impedance. The 1 k Ω load resistor was chosen to provide the best performance on our evaluation board. See Figure 9 in Typical Performance Characteristics for an example of bandwidth achieved with less loading on the outputs. For this technique to provide maximum benefit a very high speed amplifier such as the LMH6703 should be used, as shown in Figure 38. Besides offering enhanced bandwidth performance using an external buffer provides for greater system reliability. The first advantage is to reduce thermal loading on the crosspoint switch. This reduced die temperature will increase the life of the crosspoint. The second advantage is enhanced ESD reliability. It is very difficult to build high speed devices that can withstand all possible ESD events. With external buffers the crosspoint switch is isolated from ESD events on the external system connectors. Figure 38. Buffered Output 12 Submit Documentation Feedback Copyright © 2006–2013, Texas Instruments Incorporated Product Folder Links: LMH6583 |
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