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BLF369 Datasheet(PDF) 11 Page - NXP Semiconductors |
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BLF369 Datasheet(HTML) 11 Page - NXP Semiconductors |
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11 / 17 page  xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx Fig 14. Class-AB common-source 225 MHz test circuit; VD1(test), VD2(test), VG1(test) and VG2(test) are drain and gate test voltages 001aae535 50 Ω 50 Ω C7 C32 + VD2(test) + VG2(test) L4 R9 R8 R10 C8 C9 C27 C26 C25 + VG1(test) R6 R5 R7 C24 C22 C23 C6 + VD1(test) L2 L1 L5 L6 L3 C1 C3 C20 C21 C5 C4 C12 C10 C11 R2 R1 C2 C15 C13 C14 R4 R3 C31 B2 B1 T3 T4 T1 T2 C28 C29 R11 R12 C30 C33 |
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