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M36W108 Datasheet(PDF) 15 Page - STMicroelectronics |
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M36W108 Datasheet(HTML) 15 Page - STMicroelectronics |
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15 / 35 page ![]() 15/35 M36W108T, M36W108B Table 14. DC Characteristics (TA = 0 to 70°C, –20 to 85°C, –40 to 85°C; VCCF = VCCS = 2.7V to 3.6V) Note: 1. Sampled only, not 100% tested. Symbol Parameter Test Condition Min Max Unit ILI Input Leakage Current 0V ≤ VIN ≤ VCCF / VCCS –1 1 µA ILO Output Leakage Current 0V ≤ VOUT ≤ VCCF / VCCS –1 1 µA ICCF1 Flash Chip Supply Current (Read) EF = VIL, G = VIH, f = 6MHz, V ≤ VOUT ≤ VCCF 10 mA ICCF2 (1) Flash Chip Supply Current (Write) Program or Erase in progress 20 µA ICCF3 Flash Chip Supply Current (Stand-by) EF = VCCF ± 0.2V 100 µA ICCS1 SRAM Chip Supply Current (Read) E1S = VIL, E2S = VIH, f= 10MHz 40 mA E1S = VIL, E2S = VIH, f= 1MHz 10 mA ICCS2 (1) SRAM Chip Supply Current (Write) 20 mA ICCS3 SRAM Chip Supply Current (Stand-by) 20 µA VILF Flash Chip Input Low Voltage –0.5 0.8 V VIHF Flash Chip Input High Voltage 0.7 VCCF VCCF + 0.3 V VILS SRAM Chip Input Low Voltage –0.3 0.4 V VIHS SRAM Chip Input High Voltage 2.2 VCCS + 0.3 V VOLF Flash Chip Output Low Voltage IOL = 1.8mA 0.45 V VOHF Flash Chip Output High Voltage IOH = –100µA VCCF – 0.4 V VOLS SRAM Chip Output Low Voltage IOL = 2.1mA 0.4 V VOHS SRAM Chip Output High Voltage IOH = –1.0mA 2.2 V Table 15. Capacitance (1) (TA = 25 °C, f = 1 MHz) Note: 1. Sampled only, not 100% tested. Symbol Parameter Test Condition Min Max Unit CIN Input Capacitance VIN = 0V 6pF COUT Output Capacitance VOUT = 0V 12 pF Figure 5. AC Testing Load Circuit AI01968 0.8V OUT CL = 30pF or 100pF CL includes JIG capacitance 3.3k Ω 1N914 DEVICE UNDER TEST Table 16. AC Measurement Conditions Input Rise and Fall Times ≤ 10ns Input Pulse Voltages 0 to 3V Input and Output Timing Ref. Voltages 1.5V Figure 4. AC Testing Input/Output Waveforms AI01417 3V 0V 1.5V |
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