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RX72N Datasheet(PDF) 159 Page - Renesas Technology Corp

Part # RX72N
Description  Renesas MCUs
PDF  179 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

RX72N Datasheet(HTML) 159 Page - Renesas Technology Corp

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R01DS0343EJ0120 Rev.1.20
Page 159 of 179
Nov 15, 2023
RX72N Group
2. Electrical Characteristics
Note:
The above specification values apply when there is no access to the external bus during A/D conversion. If access proceeds
during A/D conversion, values may not fall within the above ranges.
Note 1. The conversion time includes the sampling time and the comparison time. As the test conditions, the number of sampling states
is indicated.
Note 2. The value in parentheses indicates the sampling time.
Table 2.54
12-Bit A/D (Unit 1) Conversion Characteristics
Conditions: VCC = AVCC0 = AVCC1 = VCC_USB = VBATT = 2.7 to 3.6 V, 2.7 V ≤ VREFH0 ≤ AVCC0,
VSS = AVSS0 = AVSS1 = VREFL0 = VSS_USB = 0 V,
PCLKB = PCLKD = 1 MHz to 60 MHz, Ta = Topr, Source impedance = 1.0 kΩ
Item
Min.
Typ.
Max.
Unit
Test Conditions
Resolution
8
—
12
Bit
Conversion time*1
(Operation at PCLKD = 60 MHz)
0.88
(0.633)*2
—
—
µs
Sampling in 38 states
(ADSAM.SAM = 1)
Conversion time*1
(Operation at PCLKD = 30 MHz)
1
(0.500)*2
—
—
µs
Sampling in 15 states
(ADSAM.SAM = 1)
Analog input capacitance
—
—
30
pF
Offset error
—
±2.0
±3.5
LSB
Full-scale error
—
±2.0
±3.5
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±4.0
±6.0
LSB
DNL differential nonlinearity error
(Operation at PCLKD = 60 MHz)
—
±1.5
±4.0
LSB
DNL differential nonlinearity error
(Operation at PCLKD = 30 MHz)
—
±1.5
±2.5
LSB
INL integral nonlinearity error
(Operation at PCLKD = 60 MHz)
—
±2.0
±4.0
LSB
INL integral nonlinearity error
(Operation at PCLKD = 30 MHz)
—
±2.0
±3.5
LSB
Table 2.55
A/D Internal Reference Voltage Characteristics
Conditions: VCC = AVCC0 = AVCC1 = VCC_USB = VBATT = 2.7 to 3.6 V, 2.7 V ≤ VREFH0 ≤ AVCC0,
VSS = AVSS0 = AVSS1 = VREFL0 = VSS_USB = 0 V,
PCLKB = PCLKD = 60 MHz, Ta = Topr
Item
Min.
Typ.
Max.
Unit
Test Conditions
A/D internal reference voltage
1.13
1.18
1.23
V



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