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LTC6910 Datasheet(PDF) 1 Page - Analog Devices |
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LTC6910 Datasheet(HTML) 1 Page - Analog Devices |
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1 / 10 page ![]() Circuit Note CN-0582 analog.com Circuits from the Lab™ circuits from Analog Devices have been designed and built by Analog Devices engineers. Standard engineering practices have been employed in the design and construction of each circuit, and their function and performance have been tested and verified in a lab environment at room temperature. However, you are solely responsible for testing the circuit and determining its suitability and applicability for your use and application. Accordingly, in no event shall Analog Devices be liable for direct, indirect, special, incidental, consequential or punitive damages due to any cause whatsoever connected to the use of any Circuits from the Lab circuits. (Continued on last page) Rev. A | 1 of 10 Circuits from the Lab ® refer- ence designs are engineered and tested for quick and easy system integration to help solve today’s analog, mixed- signal, and RF design chal- lenges. For more information and/or support, visit www.analog.com/CN0582. Devices Connected/Referenced Devices Connected/Referenced ADA4099 50 V, 8 MHz, 1.5 mA per Channel, Robust, Over-the-Top, Precision OpAmps AD9833 Low Power, 12.65 mW, 2.3 V to 5.5 V, Programmable Waveform Generator LTC6910 Digitally Controlled Programmable Gain Amplifier in SOT-23 AD5543 16-Bit DAC in μSOIC-8 Package ADA4522 55 V, EMI Enhanced, Zero Drift, Ultralow Noise, Rail-to-Rail Output Operational Amplifiers ADG5436 High Voltage Latch-Up Proof, Dual SPDT Switch ADA4807 3.1 nV/√Hz, 1 mA, 180 MHz, Rail- to-Rail Input/Output Amplifier ADP7118 20 V, 200 mA, Low Noise, CMOS LDO Linear Regulator ADA4945 High Speed, ±0.1 μV/˚C Offset Drift, Fully Differential ADC Driver ADP7182 –28 V, −200 mA, Low Noise, Linear Regulator ADP7142 40 V, 200 mA, Low Noise, CMOS LDO Linear Regulator ADG5401 High Voltage Latch-Up Proof, Single SPST Switch LT8330 Low IQ Boost/SEPIC/Inverting Converter with 1 A, 60 V Switch LTC3112 15 V, 2.5 A Synchronous Buck-Boost DC/DC Converter ADP1708 1 A, Low Dropout, CMOS Linear Regulator LT3092 200 mA 2-Terminal Programmable Current Source ADP5071 2 A/1.2 A DC-to-DC Switching Regulator with Independent Positive and Negative Outputs ADG839 0.35 Ω CMOS 1.65 V to 3.6 V Single SPDT Switch/ 2:1 MUX AD5686R Quad, 16-Bit nanoDAC+ with SPI Interface ADG1219 Low Capacitance, Low Charge Injection, ±15 V/ 12 V iCMOS SPDT in SOT-23 ADR4540 Ultralow Noise, High Accuracy 4.096 V Voltage Reference MAX14595 High Speed, Open-Drain Capable Logic-Level Translator AD7768-4 Precision 24-Bit, 1024 kSPS, Sigma-Delta (Σ-Δ) ADC with Power Scaling MAX7312 2-Wire-Interfaced 16-Bit I/O Port Expander with Interrupt and Hot- Insertion Protection USB 3.0 Quad-Channel IEPE Vibration Sensor Measurement System EVALUATION AND DESIGN SUPPORT ► Circuit Evaluation Boards ► EVAL-CN0582-USBZ ► Design and Integration Files ► Schematics, Layout Files, Bill of Materials, Software CIRCUIT FUNCTIONS AND BENEFITS Integrated electronics piezoelectric (IEPE) and IEPE-compatible accelerometers and velocity sensors are used in a wide array of condition-based monitoring (CbM), building monitoring, and struc- tural analysis applications. Often multiple channels are used to measure 3-dimensional acceleration at a single location, or multiple 1-dimensional measurements at several locations. Benchtop data acquisition (DAQ) systems are applicable in re- search and calibration environments, however these usually come in sizes and at costs that are not conducive for direct integration into end applications. The circuit shown in Figure 1 is a self-contained, USB-based quad- input channel IEPE data acquisition system. The four channels are simultaneously sampled with 24-bit resolution and have a sample rate of up to 256 kSPS. The signal chain is dc-coupled, providing frequency response to 0 Hz, while a dc offsetting circuit maximizes the dynamic range. Each input channel includes a constant current source for powering standard IEPE sensors. All data signals and power rails are derived from a single USB 3.0 connection. The system also includes an on-board direct digital synthesis (DDS) signal generator, which can be used for electrical calibration or as an excitation source to a shaker table or vibration calibrator for sensor and system-level calibration. Data can be captured and analyzed with the companion software application, and custom software can be developed using the provided application programming interface (API). |
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