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AT91SAM9263 Datasheet(PDF) 63 Page - ATMEL Corporation |
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AT91SAM9263 Datasheet(HTML) 63 Page - ATMEL Corporation |
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63 / 1029 page  63 6249B–ATARM–14-Dec-06 AT91SAM9263 Preliminary 12. AT91SAM9263 Debug and Test 12.1 Description The AT91SAM9263 features a number of complementary debug and test capabilities. A com- mon JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as downloading code and single-stepping through programs. An ETM (Embedded Trace Macro- cell) provides more sophisticated debug features such as address and data comparators, half- rate clock mode, counters, sequencer and FIFO. The Debug Unit provides a two-pin UART that can be used to upload an application into internal SRAM. It manages the interrupt han- dling of the internal COMMTX and COMMRX signals that trace the activity of the Debug Communication Channel. A set of dedicated debug and test input/output pins gives direct access to these capabilities from a PC-based test environment. |
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