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33910 Datasheet(PDF) 16 Page - Freescale Semiconductor, Inc |
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33910 Datasheet(HTML) 16 Page - Freescale Semiconductor, Inc |
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16 / 44 page ![]() Analog Integrated Circuit Device Data 16 Freescale Semiconductor 33910 ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS TIMING DIAGRAMS Figure 4. Test Circuit for Transient Test Pulses (LIN) Figure 5. Test Circuit for Transient Test Pulses (L1) Figure 6. Test Circuit for LIN Timing Measurements LIN TRANSIENT PULSE PGND GENERATOR 1.0nF (NOTE) NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b. GND 33910 LGND AGND L1 TRANSIENT PULSE PGND GENERATOR 1.0nF (NOTE) 10k Ω NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b. GND 33910 LGND AGND R0 AND C0 COMBINATIONS: • 1.0K Ω and 1.0nF • 660 Ω and 6.8nF • 500 Ω and 10nF VSUP TXD RXD LIN R0 C0 C0 |
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