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SWT805-S Datasheet(PDF) 7 Page - Seoul Semiconductor

Part # SWT805-S
Description  surface-mount LED
PDF  17 Pages
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Manufacturer  SEOUL [Seoul Semiconductor]
Direct Link  http://www.seoulsemicon.com
Logo SEOUL - Seoul Semiconductor

SWT805-S Datasheet(HTML) 7 Page - Seoul Semiconductor

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Document No. : SSC-QP-7-07-24 (Rev.00)
Rev. 00
Rev. 00
January, 2009
January, 2009
www.
www.acriche
acriche.com
.com
5. Reliability Test
0/22
3 Time
1KV at 1.5kΩ; 100pF
MIL-STD-
883D
ESD(HBM)
0/22
1,000 Hours
T
a =-40
oC, I
F =20mA
Internal
Reference
Low Temperature
Life Test
0/22
1,000 Hours
T
a =60
oC, I
F =20mA
Internal
Reference
High Temperature
Life Test
0/22
1,000 Hours
T
a =60
oC, RH=90%, I
F =20mA
Internal
Reference
High Temperature /
Humidity Life
0/22
1,000 Hours
T
a =25
oC, I
F =20mA
Internal
Reference
Operating
Endurance Test
0/22
1,000 Hours
T
a =-40
oC
EIAJ ED-4701
Low Temperature
Storage
0/22
1,000 Hours
T
a =85
oC, RH=85%
EIAJ ED-4701
High Temperature
High Humidity
Storage
0/22
1,000 Hours
T
a =100
oC
EIAJ ED-4701
High Temperature
Storage
0/22
100 Cycle
T
a =-40
oC (30MIN) ~ 25oC (5MIN)
~ 100oC (30MIN) ~ 25oC (5MIN)
EIAJ ED-4701
Temperature Cycle
0/22
100 Cycle
T
a =-40
oC (30MIN) ~ 100oC (30MIN)
Internal
Reference
Thermal Shock
Number of
Damage
Duration
/ Cycle
Test Condition
Reference
Item
* Criteria for Judging the Damage
-
LSL*2 × 0.7
I
F =20mA
I
V
Luminous Intensity
100
µA
-
V
R=5V
I
R
Reverse Current
USL*1 × 1.1
-
I
F =20mA
V
F
Forward Voltage
MAX
MIN
Criteria for Judgement
Condition
Symbol
Item
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
*ESD guarantee condition
CONTACT
I
R =100 ㎂ and below
1,000 V
HBM
Test Form
Criteria for Judgement
Test Condition
Item



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