MAXQ2010-RFX+ datasheet(30/34 Pages) MAXIM

30 / 34 page

16-Bit Mixed-Signal Microcontroller

with LCD Interface

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Applications Information

The low-power, high-performance RISC architecture of

this device makes it an excellent fit for many portable or

battery-powered applications that require cost-effective

computing. The high-throughput core is complemented

by a 16-bit hardware multiplier-accumulator, allowing

the implementation of sophisticated computational

algorithms. Applications benefit from a wide range of

peripheral interfaces, allowing the microcontroller to

communicate with many external devices. With integrat-

ed LCD support of up to 160 segments, applications

can support complex user interfaces. Displays are dri-

ven directly with no additional external hardware

required. Contrast can be adjusted using a built-in,

adjustable resistor. The simplified architecture reduces

component count and board space, critical factors in

the design of portable systems.

The MAXQ2010 is ideally suited for applications such

as medical instrumentation, portable blood-glucose

equipment, and data-collection devices. For blood-glu-

cose measurement, the microcontroller integrates an

SPI interface that directly connects with analog front-

ends for measuring test strips.

Grounds and Bypassing

Careful PCB layout significantly minimizes noise on the

analog inputs, resulting in less noise on the digital I/O

that could cause improper operation. The use of multi-

layer boards is essential to allow the use of dedicated

power planes. The area under any digital components

should be a continuous ground plane if possible. Keep

any bypass capacitor leads short for best noise rejec-

tion and place the capacitors as close to the leads of

the devices as possible.

Separate ground areas must be provided for the analog

(AGND) and digital (DGND) portions, connected

together at a single point.

CMOS design guidelines for any semiconductor require

that no pin be taken above VDVDD or below DGND.

Violation of this guideline can result in a hard failure

(damage to the silicon inside the device) or a soft fail-

ure (unintentional modification of memory contents).

Voltage spikes above or below the device’s absolute

maximum ratings can potentially cause a devastating

IC latchup.

Microcontrollers commonly experience negative volt-

age spikes through either their power pins or general-

purpose I/O pins. Negative voltage spikes on power

pins are especially problematic as they directly couple

to the internal power buses. Devices such as keypads

can conduct electrostatic discharges directly into the

microcontroller and seriously damage the device.

System designers must protect components against

these transients that can corrupt system memory.

TAP

CONTROLLER

CPU

DEBUG

ENGINE

DEBUG

SERVICE

ROUTINES

(UTILITY ROM)

CONTROL

BREAKPOINT

ADDRESS

DATA

TMS

TCK

TDI

TDO

MAXQ2010

Figure 9. In-Circuit Debugger

MAXQ2010-RFX+ Datasheet(PDF) 30 Page - Maxim Integrated Products

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