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DAC7718 Datasheet(PDF) 16 Page - Texas Instruments |
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DAC7718 Datasheet(HTML) 16 Page - Texas Instruments |
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16 / 60 page ![]() DAC7718 SBAS467A – MAY 2009 – REVISED DECEMBER 2009 www.ti.com TIMING CHARACTERISTICS: IOVDD = +5V (1) (2) (3) (4) At –40°C to +105°C, DVDD = +5V, and IOVDD = +5V, unless otherwise noted. PARAMETER MIN MAX UNIT fSCLK Clock frequency 50 MHz t1 SCLK cycle time 20 ns t2 SCLK high time 10 ns t3 SCLK low time 7 ns t4 CS falling edge to SCLK falling edge setup time 8 ns t5 SDI setup time before falling edge of SCLK 5 ns t6 SDI hold time after falling edge of SCLK 5 ns t7 SCLK falling edge to CS rising edge 5 ns t8 CS high time 10 ns t9 CS rising edge to LDAC falling edge 5 ns t10 LDAC pulse duration 10 ns t11 Delay from SCLK rising edge to SDO valid 3 8 ns t12 Delay from CS rising edge to SDO Hi-Z 5 ns t13 Delay from CS falling edge to SDO valid 6 ns t14 SDI to SDO delay during sleep mode 2 5 ns (1) Specified by design. Not production tested. (2) Sample tested during the initial release and after any redesign or process changes that may affect these parameters. (3) All input signals are specified with tR = tF = 2ns (10% to 90% of IOVDD) and timed from a voltage level of IOVDD/2. (4) SDO loaded with 10 Ω series resistance and 10pF load capacitance for SDO timing specifications. BLANKSPACE TIMING CHARACTERISTICS: IOVDD = +3V (1) (2) (3) (4) At –40°C to +105°C, DVDD = +3V/+5V, and IOVDD = +3V, unless otherwise noted. PARAMETER MIN MAX UNIT fSCLK Clock frequency 25 MHz t1 SCLK cycle time 40 ns t2 SCLK high time 19 ns t3 SCLK low time 7 ns t4 CS falling edge to SCLK falling edge setup time 15 ns t5 SDI setup time before falling edge of SCLK 5 ns t6 SDI hold time after falling edge of SCLK 5 ns t7 SCLK falling edge to CS rising edge 10 ns t8 CS high time 19 ns t9 CS rising edge to LDAC falling edge 5 ns t10 LDAC pulse duration 10 ns t11 Delay from SCLK rising edge to SDO valid 3 15 ns t12 Delay from CS rising edge to SDO Hi-Z 7 ns t13 Delay from CS falling edge to SDO valid 10 ns t14 SDI to SDO delay during sleep mode 2 10 ns (1) Specified by design. Not production tested. (2) Sample tested during the initial release and after any redesign or process changes that may affect these parameters. (3) All input signals are specified with tR = tF = 3ns (10% to 90% of IOVDD) and timed from a voltage level of IOVDD/2. (4) SDO loaded with 10 Ω series resistance and 10pF load capacitance for SDO timing specifications. 16 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): DAC7718 |
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