TLC5970

SBVS140 – MARCH 2010

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

TRANSPORT MEDIA,

PRODUCT

PACKAGE-LEAD

ORDERING NUMBER

QUANTITY

TLC5970DAPR

Tape and Reel, 2000

TLC5970DAP

Tube, 46

TLC5970

TLC5970RHPR

Tape and Reel, 3000

QFN-28 6.0 mm × 6.0 mm

TLC5970RHPT

Tape and Reel, 250

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Product preview device.

ABSOLUTE MAXIMUM RATINGS

(1) (2)

Over operating free-air temperature range, unless otherwise noted.

VALUE

UNIT

MIN

MAX

Supply voltage

–0.3

+40

V

BOOT

–0.3

+50

V

BOOT-PH difference

–0.3

+10

V

FB

–0.3

+18

V

Input voltage

IREF0 to IREF2, SWOFF

–0.3

VREG + 0.3

V

SDTA, SDTB, SCKA, SCKB

–10

+15

V

VROM

–0.3

+21

V

PH (steady-state)

–0.6

+40

V

PH (transient < 10 ns)

–1.2

V

Output voltage

OUT0 to OUT2

–0.3

+18

V

SDTY, SDTZ, SCKY, SCKZ

–10

+15

V

VREG, VREGIF

–0.3

+6

V

PH (dc)

–800

mA

PH (peak)

–2

A

Output current

OUT0 to OUT2

+180

mA

SDTY, SDTZ, SCKY, SCKZ

–35

+35

mA

Human body model (HBM) SDTA, SDTB, SCKA, SCKB,

4

kV

SDTY, SDTZ, SCKY, SCKZ

Human body model (HBM) Other pins

2

kV

Electrostatic discharge rating

Charged device model (CDM) SDTA, SDTB, SCKA, SCKB,

1000

V

SDTY, SDTZ, SCKY, SCKZ

Charged device model (CDM) Other pins

500

V

Operation junction temperature

+150

°C

Storage temperature

–55

+150

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to network ground terminal.

2

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