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AM1707 Datasheet(PDF) 194 Page - Texas Instruments |
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AM1707 Datasheet(HTML) 194 Page - Texas Instruments |
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194 / 198 page ![]() X AM1707 ( ) ZKB ( ) 3 PREFIX X = Experimental Device P = Prototype Device Blank = Production Device DEVICE SILICON REVISION 3 = 375 MHz 4 = 456 MHz Blank PACKAGE TYPE 256 Pin Plastic BGA, with Pb-free Soldered Balls [Green] ZKB = DEVICE SPEED RANGE TEMPERATURE RANGE (JUNCTION) B = Silicon Revision 2.0 = 0°C to 90°C (Commercial Grade) = -40°C to 90°C (Industrial Grade) D A = -40°C to 105°C( Extended Grade) T = -40°C to 125°C( Automotive Grade) AM1707 SPRS637A – FEBRUARY 2010 – REVISED APRIL 2010 www.ti.com 8 Mechanical Packaging and Orderable Information This section describes the device orderable part numbers, packaging options, materials, thermal and mechanical parameters. 8.1 Device and Development-Support Tool Nomenclature To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all AM1xxx processors and support tools. Each commercial AM1xxx platform member has one of three prefixes: X, P, or null (no prefix). Texas Instruments recommends two of three possible prefix designators for its support tools: TMDX and TMDS. These prefixes represent evolutionary stages of product development from engineering prototypes (TMDX) through fully qualified production devices/tools (TMDS). Device development evolutionary flow: X Experimental device that is not necessarily representative of the final device's electrical specifications. P Final silicon die that conforms to the device's electrical specifications but has not completed quality and reliability verification. NULL Fully-qualified production device. Support tool development evolutionary flow: TMDX Development-support product that has not yet completed Texas Instruments internal qualification testing. TMDS Fully qualified development-support product. X and P devices and TMDX development-support tools are shipped against the following disclaimer: "Developmental product is intended for internal evaluation purposes." NULL devices and TMDS development-support tools have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies. Predictions show that prototype devices (X or P) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used. Figure 8-1 provides a legend for reading the device. Figure 8-1. Device Nomenclature 8.2 Thermal Data for ZKB The following table(s) show the thermal resistance characteristics for the PBGA–ZKB mechanical package. 194 Mechanical Packaging and Orderable Information Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): AM1707 |
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