OPA141

OPA2141

OPA4141

SBOS510B – MARCH 2010 – REVISED MAY 2010

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

VALUE

UNIT

Supply Voltage

±20

V

(V–) –0.5 to (V+) +0.5

V

Signal Input

Terminals

±10

mA

Continuous

–55 to +150

°C

–65 to +150

°C

+150

°C

Human Body Model (HBM)

2000

V

ESD Ratings

Charged Device Model (CDM)

500

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current limited to 10 mA or less.

(3)

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

SO-8

D

O141A

OPA141

MSOP-8

DGK

141

SO-8

D

O2141A

OPA2141

MSOP-8

DGK

2141

TSSOP-14

PW

O4141A

OPA4141

SO-14

D

O4141AG4

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

2

Copyright © 2010, Texas Instruments Incorporated

Product Folder Link(s): OPA141 OPA2141 OPA4141