HCPL2631 datasheet(4/10 Pages) QT

4 / 10 page

Characteristics

Test Conditions

Symbol

Min

Typ**

Max

Unit

Input-Output

(Relative humidity = 45%)

Insulation Leakage Current

(TA = 25°C, t = 5 s)

II-O

1.0*

µA

(VI-O = 3000 VDC)

(Note 12)

Withstand Insulation Test Voltage

(RH < 50%, TA = 25°C)

VISO

2500

VRMS

(Note 12) ( t = 1 min.)

Resistance (Input to Output)

(VI-O = 500 V) (Note 12)

RI-O

1012

Capacitance (Input to Output)

(f = 1 MHz) (Note 12)

CI-O

0.6

ISOLATION CHARACTERISTICS (T

A = -40°C to +85°C Unless otherwise specified.)

** All typical values are at VCC = 5 V, TA = 25°C

The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum

capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins

of each device.

Each channel.

Enable Input - No pull up resistor required as the device has an internal pull up resistor.

tPLH - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5 V

level on the LOW to HIGH transition of the output voltage pulse.

tPHL - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5 V

level on the HIGH to LOW transition of the output voltage pulse.

tr - Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.

tf - Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.

tELH - Enable input propagation delay is measured from the 1.5 V level on the HIGH to LOW transition of the input voltage pulse

to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.

tEHL - Enable input propagation delay is measured from the 1.5 V level on the LOW to HIGH transition of the input voltage pulse

to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.

10. CMH - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state

(i.e., VOUT > 2.0 V). Measured in volts per microsecond (V/µs).

11. CML - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low output state

(i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/µs).

12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.

NOTES

DC Characteristics

Test Conditions

Symbol

Min

Typ**

Max

Unit

High Level Output Current

(VCC = 5.5 V, VO = 5.5 V)

IOH

100

µA

(IF = 250 µA, VE = 2.0 V) (Note 2)

Low Level Output Current

(VCC = 5.5 V, IF = 5 mA)

VOL

.35

.06

(VE = 2.0 V, ICL = 13 mA) (Note 2)

Input Threshold Current

(VCC = 5.5 V, VO = 0.6 V,

IFT

VE = 2.0 V, IOL = 13 mA)

TRANSFER CHARACTERISTICS (T

A = -40°C to +85°C Unless otherwise specified.)

SINGLE-CHANNEL

DUAL-CHANNEL

6N137

HCPL-2630

HCPL-2601

HCPL-2631

HCPL-2611

HIGH SPEED-10 MBit/s

LOGIC GATE OPTOCOUPLERS

8/10/99

200002A

HCPL2631 Datasheet(PDF) 4 Page - QT Optoelectronics

HCPL2631 Datasheet(HTML) 4 Page - QT Optoelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10

Datasheet Download

Link URL