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56F8036 Datasheet(PDF) 32 Page - Freescale Semiconductor, Inc |
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56F8036 Datasheet(HTML) 32 Page - Freescale Semiconductor, Inc |
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32 / 164 page ![]() 56F8036 Data Sheet, Rev. 6 32 Freescale Semiconductor TCK (GPIOD2) 21 Input Input/ Output Input, internal pull-up enabled Test Clock Input — This input pin provides a gated clock to synchronize the test logic and shift serial data to the JTAG/EOnCE port. The pin is connected internally to a pull-up resistor. A Schmitt trigger input is used for noise immunity. Port D GPIO — This GPIO pin can be individually programmed as an input or output pin. After reset, the default state is TCK. TMS (GPIOD3) 47 Input Input/ Output Input, internal pull-up enabled Test Mode Select Input — This input pin is used to sequence the JTAG TAP controller’s state machine. It is sampled on the rising edge of TCK and has an on-chip pull-up resistor. Port D GPIO — This GPIO pin can be individually programmed as an input or output pin. After reset, the default state is TMS. Note: Always tie the TMS pin to VDD through a 2.2K resistor. Return to Table 2-2 Table 2-3 56F8036 Signal and Package Information for the 48-Pin LQFP (Continued) Signal Name LQFP Pin No. Type State During Reset Signal Description |
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