IP4359CX4

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Product data sheet

Rev. 1 — 6 August 2010

5 of 12

NXP Semiconductors

IP4359CX4

Dual channel low capacitance ESD protection

6.2 Crosstalk

The crosstalk measurement configuration of a typical 50

Ω NWA system for evaluation of

the IP4359CX4 is shown in Figure 3.

The crosstalk measurement results of IP4359CX4 are depicted in Figure 4.

Fig 3.

Crosstalk measurement configuration

Pin A1 to pin A2.

Fig 4.

Measured crosstalk between different channels

OUT_2

001aai756

50

Ω

50

Ω

Vgen

DUT

IN_1

OUT_1

IN_2

TEST BOARD

50

Ω

50

Ω

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−60

−40

−80

−20

0

−100

f (MHz)

10

(dB)