ADS1194 datasheet(2/80 Pages) TI

2 / 80 page

ADS1294

, ADS1296

ADS1298

SBAS459E – JANUARY 2010 – REVISED AUGUST 2010

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FAMILY AND ORDERING INFORMATION(1)

MAXIMUM

OPERATING

PACKAGE

NUMBER OF

ADC

SAMPLE RATE

TEMPERATURE

RESPIRATION

PRODUCT

OPTION

CHANNELS

RESOLUTION

(kSPS)

RANGE

CIRCUITRY

ADS1194

TQFP

0°C to +70°C

ADS1196

TQFP

0°C to +70°C

ADS1198

TQFP

0°C to +70°C

ADS1294

BGA

0°C to +70°C

External

ADS1296

BGA

0°C to +70°C

External

ADS1298

BGA

0°C to +70°C

External

ADS1298I

TQFP

–40°C to +85°C

External

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

ADS1294, ADS1296, ADS1298

UNIT

AVDD to AVSS

–0.3 to +5.5

DVDD to DGND

–0.3 to +3.9

AVSS to DGND

–3 to +0.2

VREF input to AVSS

AVSS – 0.3 to AVDD + 0.3

Analog input to AVSS

AVSS – 0.3 to AVDD + 0.3

Digital input voltage to DGND

–0.3 to DVDD + 0.3

Digital output voltage to DGND

–0.3 to DVDD + 0.3

Digital input voltage to DGND

–0.3 to DVDD + 0.3

Digital output voltage to DGND

–0.3 to DVDD + 0.3

Input current (momentary)

100

Input current (continuous)

Operating

Commercial grade: ADS1294, ADS1296, ADS1298

0 to +70

°C

temperature

Industrial grade: ADS1298I

–40 to +85

°C

range

Human body model (HBM)

±2000

JEDEC standard 22, test method A114-C.01, all pins

ESD ratings

Charged device model (CDM)

±500

JEDEC standard 22, test method C101, all pins

Storage temperature range

–60 to +150

°C

Maximum junction temperature (TJ)

+150

°C

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

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Product Folder Link(s): ADS1294 ADS1296 ADS1298

ADS1194 Datasheet(PDF) 2 Page - Texas Instruments

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