TLE4998P3 datasheet(11/34 Pages) INFINEON

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TLE4998P

Maximum Ratings

Data Sheet

V 1.0, 2008-07

Maximum Ratings

Note: Stresses above those listed under “Absolute Maximum Ratings” may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions above those indicated in

the operational sections of this specification is not implied.

Exposure to absolute maximum rating conditions for extended periods may affect

device reliability.

Table 3

Absolute Maximum Ratings

Parameter

Symbol

Limit Values

Unit

Notes

min.

max.

Storage temperature

TST

- 40

150

°C

Junction temperature

- 40

1701)

1) For limited time of 96 h. Depends on customer temperature lifetime cycles. Please ask Infineon for support

°C

Voltage on

VDD pin with

respect to ground

VDD

-18

2) Higher voltage stress than absolute maximum rating, e.g. 150% in latch-up tests is not applicable. In such

cases, Rseries ≥100Ω for current limitation is required

Supply current

@ overvoltage VDD max.

IDDov

Reverse supply current

@ VDD min.

IDDrev

-1

Voltage on output pin with

respect to ground

OUT

-13)

3) I

DD can exceed 10 mA when the voltage on OUT is pulled below -1 V (-5 V at room temperature)

184)

4) V

DD = 5 V, open drain permanent low, for max. 10 min

Magnetic field

BMAX

unlimited

ESD protection

VESD

4.0

According HBM

JESD22-A114-B 5)

5) 100 pF and 1.5 k

Ω

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