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OR3LP26B Datasheet(PDF) 178 Page - Agere Systems |
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OR3LP26B Datasheet(HTML) 178 Page - Agere Systems |
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178 / 184 page ![]() 178 178 Lucent Technologies Inc. ORCA OR3LP26B FPSC Data Sheet Embedded Master/Target PCI Interface March 2000 Lucent Technologies Inc. Package Thermal Characteristics Summary There are three thermal parameters that are in com- mon use: ΘJA, ψJC, and ΘJC. It should be noted that all the parameters are affected, to varying degrees, by package design (including paddle size) and choice of materials, the amount of copper in the test board or system board, and system airflow. ΘJA This is the thermal resistance from junction to ambient (theta-JA, R-theta, etc.). where TJ is the junction temperature, TA is the ambient air temperature, and Q is the chip power. Experimentally, ΘJA is determined when a special ther- mal test die is assembled into the package of interest, and the part is mounted on the thermal test board. The diodes on the test chip are separately calibrated in an oven. The package/board is placed either in a JEDEC natural convection box or in the wind tunnel, the latter for forced convection measurements. A controlled amount of power (Q) is dissipated in the test chip’s heater resistor, the chip’s temperature (TJ) is deter- mined by the forward drop on the diodes, and the ambi- ent temperature (TA) is noted. Note that ΘJA is expressed in units of °C/W. ψJC This JEDEC designated parameter correlates the junc- tion temperature to the case temperature. It is generally used to infer the junction temperature while the device is operating in the system. It is not considered a true thermal resistance, and it is defined by: where TC is the case temperature at top dead center, TJ is the junction temperature, and Q is the chip power. During the ΘJA measurements described above, besides the other parameters measured, an additional temperature reading, TC, is made with a thermocouple attached at top-dead-center of the case. ψJC is also expressed in units of °C/W. ΘJC This is the thermal resistance from junction to case. It is most often used when attaching a heat sink to the top of the package. It is defined by: The parameters in this equation have been defined above. However, the measurements are performed with the case of the part pressed against a water-cooled heat sink to draw most of the heat generated by the chip out the top of the package. It is this difference in the measurement process that differentiates ΘJC from ψ JC. ΘJC is a true thermal resistance and is expressed in units of °C/W. ΘJB This is the thermal resistance from junction to board ( ΘJB). It is defined by: where TB is the temperature of the board adjacent to a lead measured with a thermocouple. The other param- eters on the right-hand side have been defined above. This is considered a true thermal resistance, and the measurement is made with a water-cooled heat sink pressed against the board to draw most of the heat out of the leads. Note that ΘJB is expressed in units of °C/W, and that this parameter and the way it is mea- sured are still in JEDEC committee. FPGA Maximum Junction Temperature Once the power dissipated by the FPGA has been determined (see the Estimating Power Dissipation sec- tion), the maximum junction temperature of the FPGA can be found. This is needed to determine if speed der- ating of the device from the 85 °C junction temperature used in all of the delay tables is needed. Using the maximum ambient temperature, TAmax, and the power dissipated by the device, Q (expressed in °C), the max- imum junction temperature is approximated by: TJmax = TAmax + (Q • ΘJA) Table 71 lists the thermal characteristics for all pack- ages used with the ORCA OR3LP26B Series of FPGAs. ΘJA TJ TA – Q -------------------- = ψJC TJ TC – Q -------------------- = ΘJC TJ TC – Q -------------------- = ΘJB TJ TB – Q -------------------- = |
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