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LW020AF Datasheet(PDF) 8 Page - General Semiconductor

Part # LW020AF
Description  LW020 Single-Output-Series Power Modules 36 Vdc to 75 Vdc inputs 20W
PDF  16 Pages
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Manufacturer  GE [General Semiconductor]
Direct Link  http://www.vishay.com
Logo GE - General Semiconductor

LW020AF Datasheet(HTML) 8 Page - General Semiconductor

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88
Lineage Power
Data Sheet
April 2008
36 Vdc to 75 Vdc Inputs; 20 W
LW020 Single-Output-Series Power Modules:
Characteristics Curves (continued)
8-1261(C).b
Figure 9. LW020A, B, C, F, and G Typical Output
Voltage for a Step Load Change from 50%
to 25%
8-1263(C).b
Figure 10. LW020A, B, C, F, and G Typical Output
Voltage Start-Up when Signal Applied to
Remote On/Off
Test Configurations
8-203(C)
Note: Input reflected-ripple current is measured with a simulated
source impedance of 12 µH. Capacitor Cs offsets possible
battery impedance. Current is measured at the input of the
module.
Figure 11. Input Reflected-Ripple Test Setup
8-513(C)
Note: Use a 0.1 µF ceramic capacitor. Scope measurement should
be made using a BNC socket. Position the load between
50 mm and 75 mm (2 in. and 3 in.) from the module.
Figure 12. Peak-to-Peak Output Noise
Measurement Test Setup
8-204(C)
Note: All measurements are taken at the module terminals. When
socketing, place Kelvin connections at module terminals to
avoid measurement errors due to socket contact resistance.
Figure 13. Output Voltage and Efficiency
Measurement Test Setup
TIME, t (100 µs/div)
101%
VO, nom
100%
VO, nom
50%
IO, max
25%
IO, max
TIME, t (1 ms/div)
0
100%
VO, nom
50%
VO, nom
5V
0
TO OSCILLOSCOPE
12 µH
CS 220 µF
IMPEDANCE < 0.1
Ω
@ 20 ˚C, 100 kHz
VI(+)
VI(-)
BATTERY
33 µF
CURRENT
PROBE
LTEST
V O (+)
V O (-)
0.1 µF
RESISTIVE
LOAD
SCOPE
COPPER STRIP
VI(+)
VI(-)
VO(+)
VO(-)
II
IO
SUPPLY
CONTACT RESISTANCE
CONTACT AND
DISTRIBUTION LOSSES
LOAD
η
VO(+) VO(–)
–
[]IO
VI(+) VI(–)
–
[]II
------------------------------------------------
⎝⎠
⎛⎞ 100
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