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AM28F512 Datasheet(PDF) 13 Page - Advanced Micro Devices |
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AM28F512 Datasheet(HTML) 13 Page - Advanced Micro Devices |
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13 / 35 page ![]() Am28F512 13 Flasherase Electrical Erase Algorithm This Flash memory device erases the entire array in parallel. The erase time depends on VPP, temperature, and number of erase/program cycles on the device. In general, reprogramming time increases as the number of erase/program cycles increases. The Flasherase electrical erase algorithm employs an interactive closed loop flow to simultaneously erase all bits in the array. Erasure begins with a read of the mem- ory contents. The device is erased when shipped from the factory. Reading FFh data from the device would immediately be followed by executing the Flashrite pro- gramming algorithm with the appropriate data pattern. Should the device be currently programmed, data other than FFh will be returned from address locations. Follow the Flasherase algorithm. Uniform and reliable erasure is ensured by first programming all bits in the device to their charged state (Data = 00h). This is accomplished using the Flashrite Pro grammin g algorithm. Erasure then continues with an initial erase operation. Erase verification (Data = FFh) begins at address 0000h and continues through the array to the l a s t ad dres s , or unt i l da t a ot he r t h a n FF h i s encountered. If a byte fails to verify, the device is eras e d agai n. W i th eac h e ra s e operati o n , a n increasing number of bytes verify to the erased state. Typically, devices are erased in less than 100 pulses (one second). Erase efficiency may be improved by storing the address of the last byte that fails to verify in a re gist er. Followin g t he nex t era se op era tion , verification may start at the stored address location. A total of 1000 erase pulses are allowed per reprogram cycle, which corresponds to approximately 10 seconds of cumulative erase time. The entire sequence of erase and byte verification is performed with high voltage applied to the VPP pin. Figure 1 illustrates the electrical erase algorithm. Table 4. Flasherase Electrical Erase Algorithm Notes: 1. See AC and DC Characteristics for values of VPP parameters. The VPP power supply can be hard-wired to the device or switchable. When VPP is switched, VPPL may be ground, no connect with a resistor tied to ground, or less than VCC + 2.0 V. 2. Erase Verify is performed only after chip erasure. A final read compare may be performed (optional) after the register is written with the read command. 3. The erase algorithm Must Be Followed to ensure proper and reliable operation of the device. Bus Operations Command Comments Entire memory must = 00h before erasure (Note 3) Note: Use Flashrite programming algorithm (Figure 3) for programming. Standby Wait for VPP Ramp to VPPH (Note 1) Initialize: Addresses PLSCNT (Pulse count) Write Erase Setup Data = 20h Erase Data = 20h Standby Duration of Erase Operation (tWHWH2) Write Erase-Verify (Note 2) Address = Byte to Verify Data = A0h Stops Erase Operation Standby Write Recovery Time before Read = 6 µs Read Read byte to verify erasure Standby Compare output to FFh Increment pulse count Write Reset Data = FFh, reset the register for read operations Standby Wait for VPP Ramp to VPPL (Note 1) |
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