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DS1004 Datasheet(PDF) 3 Page - Dallas Semiconductor |
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DS1004 Datasheet(HTML) 3 Page - Dallas Semiconductor |
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3 / 6 page ![]() DS1004 3 of 6 DS1004 TEST CIRCUIT Figure 1 TEST SETUP DESCRIPTION Figure 1 illustrates the hardware configuration used for measuring the timing parameters of the DS1004. The input waveform is produced by a precision pulse generator under software control. Time delays are measured by a time interval counter (20 ps resolution) connected to the output. The DS1004 output taps are selected and connected to the interval counter by a VHF switch control unit. All measurements are fully automated with each instrument controlled by the computer over an IEEE 488 bus. |
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