MA9264

14/15

RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

Dynex Semiconductor can provide radiation testing

compliant with MIL-STD-883 test method 1019, Ionizing

Radiation (Total Dose).

UPSET BIT

CROSS-SECTION

Figure 17: Typical Per-Bit Upset Cross-Section vs Ion LET

SINGLE EVENT UPSET CHARACTERISTICS

Total Dose (Function to specification)*

1x10

Transient Upset (Stored data loss)

5x10

Transient Upset (Survivability)

>1x10

Neutron Hardness (Function to specification)

>1x10

Single Event Upset**

4.3x10

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Figure 16: Radiation Hardness Parameters