AN3018 datasheet(19/24 Pages) STMICROELECTRONICS

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AN3018

Self tests for SPC564Ax digital peripherals

Doc ID 16081 Rev 2

19/24

4.13

Summary for digital peripherals

The table below summarizes the self tests for digital peripherals.

Table 1.

Self tests for digital peripherals

Module

Self test

Comments

CPU core

Use software based tests.

CRC unit can be used to

accelerate result verification.

eTPU core

Use software based tests.

Flash

Flash integrity test.

Flash ECC logic verification.

Flash address decoder.

Flash margin mode.

RAM

RAM dormant fault test.

RAM ECC logic verification.

RAM address decode.

Interrupt

controller

Use an alternate vector table for interrupt

controller self tests.

Peripheral

configuration

Use DMA and CRC unit to compute a signature

on all initialized registers.

Use DMA and CRC unit to compute a signature

on registers with static configuration.

DMA

Explicit test on registers.

Implicit test if peripheral configuration self test is

implemented.

CRC

Explicit test on registers.

Implicit test if peripheral configuration self test is

implemented.

Crossbar

Implicit test if Flash, RAM and peripheral

configuration checks are implemented.

MPU

Explicit test on register and functional tests.

Peripheral bridge

Implicit test if peripheral configuration self test is

implemented.

eMIOS

Use eTPU to capture signal from eMIOS.

ADC logic

Use eQADC time stamping to capture effective

time of conversions.

FlexCAN

Loop back.

eSCI

Loop back.

Decimation filter

Use CPU instead of eQADC as source for

operands.

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