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LM2698 Datasheet(PDF) 4 Page - Texas Instruments |
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LM2698 Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 25 page ![]() LM2698 SNVS153E – MAY 2001 – REVISED APRIL 2013 www.ti.com Absolute Maximum Ratings (1) VIN −0.3V ≤ VIN ≤ 12V SW Voltage −0.3V ≤ VSW ≤ 18V FB Voltage −0.3V ≤ VFB ≤ 7V VC Voltage 0.965 < VC < 1.565 SHDN Voltage(2) −0.3V ≤ VSHDN ≤ 7V FSLCT(2) −0.3V ≤ VFSLCT ≤ 12V Maximum Junction Temperature 150°C Power Dissipation (3) Internally Limited Lead Temperature 300°C Vapor Phase (60 sec.) 215°C Infrared (15 sec.) 220°C ESD Susceptibility(4) Human Body Model(5) 2kV Machine Model 200V (1) Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the device is intended to be functional, but device parameter specifications may not be specified. For assured specifications and test conditions, see the Electrical Characteristics. (2) Shutdown and voltage frequency select should not exceed VIN. (3) The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction-to-ambient thermal resistance, θJA, and the ambient temperature, TA. See the Electrical Characteristics table for the thermal resistance of various layouts. The maximum allowable power dissipation at any ambient temperature is calculated using: PD (MAX) = (TJ(MAX) − TA)/θJA. Exceeding the maximum allowable power dissipation will cause excessive die temperature, and the regulator will go into thermal shutdown. (4) The human body model is a 100 pF capacitor discharged through a 1.5k Ω resistor into each pin. The machine model is a 200pF capacitor discharged directly into each pin. (5) ESD susceptibility using the human body model is 500V for VC. Operating Conditions Operating Junction Temperature Range(1) −40°C to +125°C Storage Temperature −65°C to +150°C Supply Voltage 2.2V to 12V SW Voltage 0 ≤ VSW ≤ 17.5V (1) All limits are specified at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are 100% tested or specified through statistical analysis. All limits at temperature extremes are specified via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). 4 Submit Documentation Feedback Copyright © 2001–2013, Texas Instruments Incorporated Product Folder Links: LM2698 |
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