LM5015

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SNVS538C – NOVEMBER 2007 – REVISED APRIL 2013

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

76V

BST to AGND

90V

PVIN to HO, LO, PGND

76V

HO to PGND (Steady State)

-3V to 76V

LO to PGND (Steady State)

-0.3V to 76V

BST to VCC

76V

BST to HO

14V

14V

COMP, FB, RT, SS to AGND

-0.3V to 7V

PGND to AGND

-0.3V to +0.3V

CFB Sink Current

10 mA

Maximum Junction Temperature

150°C

Storage Temperature

−65°C to + 150°C

ESD Rating

2 kV

(1)

Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which

operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and

specifications.

(3)

The human body model is a 100pF capacitor discharged through a 1.5 k

Ω resistor into each pin. Test Method is per JESD-22-A114.

Operating Ratings

4.25V to 75V

Operation Junction Temperature

−40°C to + 125°C

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