2-26

* Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied.

.

‡ Typical figures are at 25°C and are for design aid only: not guaranteed and not subject to production testing.

‡ Typical figures are at 25°C and are for design aid only: not guaranteed and not subject to production testing.

Figure 11 - Output Test Load

Absolute Maximum Ratings*

Parameter

Symbol

Min

Max

Units

-0.3

7

V

2

Voltage on Digital Inputs

V

3

Voltage on Digital Outputs

V

4

Current at Digital Outputs

40

mA

5

Storage Temperature

-65

+150

°C

6

Package Power Dissipation

2W

Characteristics

Sym

Min

Max

Units

Test Conditions

1

Operating Temperature

T

OP

-40

+85

°C

2

Positive Supply

V

DD

4.75

5.25

V

3

Input Voltage

V

I

0V

DD

V

Characteristics

Sym

Min

Max

Units

Test Conditions

1

I

N

P

U

T

S

Supply Current

6

10

mA

Outputs unloaded

2

Input High Voltage

2.0

V

3

Input Low Voltage

0.8

V

4

Input Leakage

5

5

Input Pin Capacitance

8pF

6

O

U

T

P

U

T

S

Output High Voltage

2.4

V

7

Output High Current

10

15

mA

8

Output Low Voltage

0.4

V

9

Output Low Current

5

10

mA

10

High Impedance Leakage

5

11

Output Pin Capacitance

8pF

Output

Pin

Test Point

S1

S2

S1 is open circuit except

when testing output levels

or high impedance states.

levels or high impedance

states.