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DS1920 Datasheet(PDF) 21 Page - Dallas Semiconductor

Part # DS1920
Description  Temperature iButton
PDF  22 Pages
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Manufacturer  DALLAS [Dallas Semiconductor]
Direct Link  https://www.maximintegrated.com/en.html
Logo DALLAS - Dallas Semiconductor

DS1920 Datasheet(HTML) 21 Page - Dallas Semiconductor

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AC ELECTRICAL CHARACTERISTICS:
1-WIRE INTERFACE
(-55°C to +100°C; VPUP=2.8V to 6.0V)
PARAMETER
SYMBOL
MIN
TYP
MAX
UNITS
NOTES
Time Slot
tSLOT
60
120
µs
Write 1 Low Time
tLOW1
1
15
µs
Write 0 Low Time
tLOW0
60
120
µs
Read Data Valid
tRDV
exactly 15
µs
Release Time
tRELEASE
0
15
45
µs
Read Data Setup
tSU
1
µs
8
Recovery Time
tREC
1
µs
Reset Time High
tRSTH
480
µs
Reset Time Low
tRSTL
480
4800
µs
6,7
Presence Detect High
tPDHIGH
15
60
µs
Presence Detect Low
tPDLOW
60
240
µs
NOTES:
1. Temperature conversion will work with ±2°C accuracy down to VPUP = 3.4V.
2. All voltages are referenced to ground.
3. IDD specified with low impedance pull up to 5.0V.
4. Active current refers to temperature conversion.
5. Writing to EEPROM consumes approximately 200
µA.
6. tRSTL may be up to 4800
µs. With longer times, the result of temperature conversion may get lost.
7. The reset low time should be restricted to a maximum of 960 ms, to allow interrupt signaling,
otherwise it could mask or conceal interrupt pulses.
8. Read data setup time refers to the time the host must pull the 1-Wire bus low to read a bit. Data is
guaranteed to be valid within 1
µs of this falling edge and will remain valid for 14 µs minimum. (15
µs total from falling edge on 1-Wire bus.)
9. Capacitance on the data contact could be 800 pF when power is first applied. If a 5k
Ω resistor is used
to pull up the data line to VCC , 5
µs after power has been applied, the parasite capacitance will not
affect normal communications.
10. Under certain low voltage conditions VILMAX may have to be reduced to as much as 0.5V to always
guarantee a presence pulse.
11. See Typical Curve for specification limits outside the 0°C to 70°C range. Thermometer error reflects
sensor accuracy as tested during calibration.



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