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LMP91000 Datasheet(PDF) 7 Page - Texas Instruments |
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LMP91000 Datasheet(HTML) 7 Page - Texas Instruments |
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7 / 31 page ![]() LMP91000 www.ti.com SNAS506I – JANUARY 2011 – REVISED DECEMBER 2014 Electrical Characteristics (continued) Unless otherwise specified, TA = 25°C, VS=(VDD – AGND), VS = 3.3 V and AGND = DGND = 0 V, VREF = 2.5 V, Internal Zero = 20% VREF. (1) PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT Transimpedance gain accuracy 5% Linearity ±0.05% 7 programmable gain resistors 2.75 3.5 7 TIA_GAIN 14 Programmable TIA Gains k Ω 35 120 350 Maximum external gain resistor 350 Internal zero voltage 3 programmable percentages of VREF 20% 50% 67% TIA_ZV 3 programmable percentages of VDD 20% 50% 67% Internal zero voltage Accuracy ±0.04% RL Programmable Load 4 programmable resistive loads 10 33 Ω 50 100 Load accuracy 5% 2.7 V ≤ VDD≤ 5.25 Internal zero 20% VREF Power Supply Rejection Ratio at V PSRR Internal zero 50% VREF 80 110 dB RE pin Internal zero 67% VREF TEMPERATURE SENSOR SPECIFICATION (Refer to Table 1 in the Feature Description for details) Temperature Error TA= –40 ˚C to 85˚C –3 3 °C Sensitivity TA= –40 ˚C to 85˚C -8.2 mV/°C Power on time 1.9 ms EXTERNAL REFERENCE SPECIFICATION VREF External Voltage reference range 1.5 VDD V Input impedance 10 M Ω 6.6 I 2C Interface Unless otherwise specified, TA = 25°C, VS = (VDD – AGND), 2.7 V <VS< 5.25 V and AGND = DGND = 0 V, VREF = 2.5 V. (1) PARAMETER TEST CONDITIONS MIN (2) TYP (3) MAX(2) UNIT VIH Input High Voltage –40 to 80°C 0.7*VDD V VIL Input Low Voltage –40 to 80°C 0.3*VDD V VOL Output Low Voltage IOUT= 3 mA 0.4 V Hysteresis (4) –40 to 80°C 0.1*VDD V CIN Input Capacitance on all digital pins –40 to 80°C 0.5 pF (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. (2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material. (4) This parameter is specified by design or characterization. Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: LMP91000 |
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