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LMP91000 Datasheet(PDF) 7 Page - Texas Instruments

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Part # LMP91000
Description  Sensor AFE System
PDF  31 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LMP91000 Datasheet(HTML) 7 Page - Texas Instruments

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LMP91000
www.ti.com
SNAS506I – JANUARY 2011 – REVISED DECEMBER 2014
Electrical Characteristics (continued)
Unless otherwise specified, TA = 25°C, VS=(VDD – AGND), VS = 3.3 V and AGND = DGND = 0 V, VREF = 2.5 V, Internal
Zero = 20% VREF.
(1)
PARAMETER
TEST CONDITIONS
MIN(2)
TYP(3)
MAX(2)
UNIT
Transimpedance gain accuracy
5%
Linearity
±0.05%
7 programmable gain resistors
2.75
3.5
7
TIA_GAIN
14
Programmable TIA Gains
k
Ω
35
120
350
Maximum external gain resistor
350
Internal zero voltage
3 programmable percentages of VREF
20%
50%
67%
TIA_ZV
3 programmable percentages of VDD
20%
50%
67%
Internal zero voltage Accuracy
±0.04%
RL
Programmable Load
4 programmable resistive loads
10
33
Ω
50
100
Load accuracy
5%
2.7 V
≤ VDD≤ 5.25
Internal zero 20% VREF
Power Supply Rejection Ratio at
V
PSRR
Internal zero 50% VREF
80
110
dB
RE pin
Internal zero 67% VREF
TEMPERATURE SENSOR SPECIFICATION (Refer to Table 1 in the Feature Description for details)
Temperature Error
TA= –40
˚C to 85˚C
–3
3
°C
Sensitivity
TA= –40
˚C to 85˚C
-8.2
mV/°C
Power on time
1.9
ms
EXTERNAL REFERENCE SPECIFICATION
VREF
External Voltage reference range
1.5
VDD
V
Input impedance
10
M
Ω
6.6 I
2C Interface
Unless otherwise specified, TA = 25°C, VS = (VDD – AGND), 2.7 V <VS< 5.25 V and AGND = DGND = 0 V, VREF = 2.5 V.
(1)
PARAMETER
TEST CONDITIONS
MIN (2)
TYP (3)
MAX(2)
UNIT
VIH
Input High Voltage
–40 to 80°C
0.7*VDD
V
VIL
Input Low Voltage
–40 to 80°C
0.3*VDD
V
VOL
Output Low Voltage
IOUT= 3 mA
0.4
V
Hysteresis (4)
–40 to 80°C
0.1*VDD
V
CIN
Input Capacitance on all digital pins
–40 to 80°C
0.5
pF
(1)
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA.
(2)
Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using
statistical quality control (SQC) method.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4)
This parameter is specified by design or characterization.
Copyright © 2011–2014, Texas Instruments Incorporated
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