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STW40N90K5 Datasheet(PDF) 5 Page - STMicroelectronics

Part # STW40N90K5
Description  N-channel 900 V, 0.088typ., 40 A MDmesh™ K5 Power MOSFETs in TO-247 and TO-247 long leads packages
PDF  14 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STW40N90K5 Datasheet(HTML) 5 Page - STMicroelectronics

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STW40N90K5, STWA40N90K5
Electrical characteristics
DocID028929 Rev 2
5/14
Table 7: Switching times
Symbol
Parameter
Test conditions
Min.
Typ.
Max
Unit
td(on)
Turn-on delay time
VDD = 450 V, ID = 40 A,
RG
= 4.7 Ω, VGS = 10 V
(see Figure 14: "Test circuit for
resistive load switching times")
-
30.4
-
ns
tr
Rise time
-
15.5
-
ns
td(off)
Turn-off-delay time
-
84.5
-
ns
tf
Fall time
-
13.4
-
ns
Table 8: Source drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max
Unit
ISD
Source-drain current
-
40
A
ISDM (1)
Source-drain current
(pulsed)
-
160
A
VSD (2)
Forward on voltage
ISD = 40 A, VGS = 0 V
-
1.5
V
trr
Reverse recovery
time
ISD = 40 A, di/dt = 100 A/µs
VDD= 60 V
(see Figure 17: "Unclamped
inductive load test circuit")
-
693
ns
Qrr
Reverse recovery
charge
-
22
µC
IRRM
Reverse recovery
current
-
63
A
trr
Reverse recovery
time
ISD = 40 A, di/dt = 100 A/µs
VDD= 60 V, TJ = 150 °C
(see Figure 17: "Unclamped
inductive load test circuit")
-
884
ns
Qrr
Reverse recovery
charge
-
29
µC
IRRM
Reverse recovery
current
-
65.5
A
Notes:
(1)Pulse width limited by safe operating area.
(2)Pulsed: pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
Parameter
Test conditions
Min
Typ.
Max.
Unit
V(BR)GSO
Gate-source breakdown voltage
IGS = ± 1mA, ID=0 A
30
-
-
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.



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